Using pulsed mode scanning electron microscopy for cathodoluminescence studies on hybrid perovskite films

Abstract The use of pulsed mode scanning electron microscopy cathodoluminescence (CL) for both hyperspectral mapping and time-resolved measurements is found to be useful the study hybrid perovskite films, a class ionic semiconductors that have been shown beam sensitive. A range acquisition parameters analysed, including current (either continuous or operation), their effect on CL emission discussed. Under optimized conditions, using beam, heterogeneity properties films can resolved via maps. These also enable polycrystalline showing significantly shorter lived charge carriers dynamics compared photoluminescence analogue, hinting at additional beam-specimen interactions further investigated. This work represents promising step investigate nanoscale with CL.